Superseded
Standard
Historical
VDE/VDI 2604*VDI/VDE 2604:1971-06
Surface measuring methods; roughness analysis by means of interference microscopy
Summary
Oberflächen-Meßverfahren; Rauheitsuntersuchung mittels Interferenzmikroskopie
Technical characteristics
| Publisher | Verein Deutscher Ingenieure e.V. (VDI) |
| Publication Date | 06/01/1971 |
| Cancellation Date | 10/01/2010 |
| Page Count | 11 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
01/06/1971
Superseded
Historical