VDI/VDE 5575 Blatt 2:2015-06
Superseded Standard
Historical

VDI/VDE 5575 Blatt 2:2015-06

X-ray optical systems - Measurement methods - Measurement set-up and methods for the evaluation of X-ray optical systems
Most recent standard

Summary

Röntgenoptische Systeme - Messverfahren - Messaufbau und Methoden zur Bewertung röntgenoptischer Systeme

Technical characteristics

Publisher Verein Deutscher Ingenieure e.V. (VDI)
Publication Date 06/01/2015
Page Count 31
EAN ---
ISBN ---
Weight (in grams) ---

Replaces

Previous versions

Contact us