Standard Specification for Iron-Nickel-Cobalt Sealing Alloy
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Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps
Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices
Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
Standard Specification for Nickel-Chromium-Iron Sealing Alloys
Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer
Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe
Standard Practice for Exposing a Membrane Switch to Variation in Atmospheric Pressure
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices [Metric]
Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric]
Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]
Standard Practice for Sample Preparation of Transparent Plastic Films for Specular Gloss Measurements, on Membrane Switch Overlays
Standard Practice for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data
