Standard Test Method for Determining the Bond Strength for a Surface Mount Device (SMD) by Applying Shear Force on a Membrane Switch
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Standard Practice for Creasing or Bending a Membrane Switch, Membrane Switch Flex Tail Assembly or Membrane Switch Component
Standard Test Method for Pass Through Flux of Circular Magnetic Sputtering Targets
Standard Specification for Chromium-Iron Sealing Alloys with 18 or 28 Percent Chromium
Standard Test Method for Verifying the Specified Dielectric Withstand Voltage and Determining the Dielectric Breakdown Voltage of a Membrane Switch
Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices [Metric]
Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components [Metric]
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
Standard Practice for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces
Standard Specification for Nickel-Clad and Nickel-Plated Steel Strip for Electron Tubes
Standard Specification for Nickel Strip for Electron Tubes
Standard Specification for Carbonized Nickel Strip and Carbonized Nickel-Plated and Nickel-Clad Steel Strip for Electron Tubes
Standard Specification for Aluminum Oxide Powder
Standard Specification for Iron-Nickel-Cobalt Sealing Alloy
