Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
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Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness
Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications
Standard Test Method for Determining the Abrasion Resistance of Inks and Coatings on Membrane Switches Using the Norman Tool "RCA" Abrader
Standard Specification for Iron-Nickel-Cobalt Sealing Alloy
Standard Test Method for Determining Color of a Membrane Switch Backlit with Diffuse Light Source
Standard Test Method for Determining Luminance of a Membrane Switch Backlit with Diffuse Light Source
Practice for Submersion of a Membrane Switch
Test Method for Determining the Electrical Resistivity of a Printed Conductive Material
Standard Test Method for Verifying the Specified Dielectric Withstand Voltage and Determining the Dielectric Breakdown Voltage of a Membrane Switch
Standard Test Method for Trace Metallic Impurities in High Purity Copper by High-Mass-Resolution Glow Discharge Mass Spectrometer
Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
Standard Practice for Visual Inspection of Semiconductor Lead-Bonding Wire
Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
Standard Practice for Exposure of Membrane Switches to Temperature and Relative Humidity
