Standard Specification for Electronic Grade Alloys of Copper and Nickel in Wrought Forms
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Standard Practices for Determining Hermeticity of Electron Devices by Dye Penetration
Standard Specification for Brazing Filler Metals for Electron Devices
Standard Test Method for Density of Fine Wire and Ribbon Wire for Electronic Devices
Standard Test Method for Surface Flaws in Tungsten Seal Rod and Wire
Standard Test Method for Measuring Diameter of Fine Wire by Weighing
Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps
Standard Specification for Chromium-Iron Sealing Alloys with 18 or 26 Percent Chromium
Standard Test Method for Sag of Tungsten Wire
Standard Specification for Tungsten Wire for Electron Devices and Lamps
Standard Specification for Molybdenum Wire and Rod for Electronic Applications
Standard Specification for Round Wire for Winding Electron Tube Grid Laterals
Standard Practice for Determining Solderability of Thick Film Conductors
Standard Specification for Molybdenum Flattened Wire for Electron Tubes
Standard Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure
