Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
€65.00
Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
€58.00
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors (Withdrawn 2023)
This product is not for sale, please contact us for more information
Standard Test Methods for Resistivity of Semiconductor Materials (Withdrawn 2003)
Standard Test Methods for Conductivity Type of Extrinsic Semiconducting Materials (Withdrawn 2003)
Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness (Withdrawn 2020)
Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications (Withdrawn 2020)
Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric) (Withdrawn 2022)
Printed electronics Materials. Semiconductor ink
€269.00
Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor
€183.00
Exposure to electric or magnetic fields in the low and intermediate frequency range. Methods for calculating current density internal field induced human body 2D models
€374.00
Mask engineering; introduction, terms and definitions
€51.99
Mask engineering; substrates
Mask engineering; blank defects
€71.85
Mask engineering; layers
