31.080.01 : Semiconductor devices in general

UNE-EN 60191-4/A2:2003

UNE-EN 60191-4/A2:2003

Superseded Historical

Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages

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UNE 21321:1978

UNE 21321:1978

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LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.

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ASTM F72-17e1

ASTM F72-17e1

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Standard Specification for Gold Wire for Semiconductor Lead Bonding

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ASTM E722-14

ASTM E722-14

Superseded Historical

Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics

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ASTM F72-24

ASTM F72-24

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Standard Specification for Gold Wire for Semiconductor Lead Bonding

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ASTM F1190-24

ASTM F1190-24

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Standard Guide for Neutron Irradiation of Unbiased Electronic Components

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ASTM F1192-24

ASTM F1192-24

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Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

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ASTM E431-96(2022)

ASTM E431-96(2022)

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Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

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ASTM E1161-21

ASTM E1161-21

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Standard Practice for Radiographic Examination of Semiconductors and Electronic Components

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ASTM F1892-12(2018)

ASTM F1892-12(2018)

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Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

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ASTM F1893-18

ASTM F1893-18

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Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)

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NF EN 61975/A1, C53-975/A1 (04/2017)

NF EN 61975/A1, C53-975/A1 (04/2017)

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High-voltage direct current (HVDC) installations - System tests

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NF EN IEC 62435-8, C96-435-8 (08/2020)

NF EN IEC 62435-8, C96-435-8 (08/2020)

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Electronic components - Long-term storage of electronic semiconductor devices - Part 8 : passive electronic devices

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NF EN IEC 60749-34-1, C96-022-34-1 (08/2025)

NF EN IEC 60749-34-1, C96-022-34-1 (08/2025)

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Dispositifs à semiconducteurs - Méthodes d’essais mécaniques et climatiques - Partie 34-1 : essai de cycles en puissance pour modules de puissance à semiconducteurs

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NF EN IEC 63364-1, C96-364-1 (01/2023)

NF EN IEC 63364-1, C96-364-1 (01/2023)

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Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour système IDO - Partie 1 : méthode d’essai de détection de variation acoustique

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