Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
This product is not for sale, please contact us for more information
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
ELECTROTECHNICAL VOCABULARY. SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS.
€94.00
GRAPHICAL SYMBOLS FOR DIAGRAMS. SEMICONDUCTORS AND ELECTRON TUBES.
€75.00
Mechanical standardization of semiconductor devices -- Part 4: Coding system and classification into forms of package outlines for semiconductor device packages.
€69.00
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
€26.00