IEC-Q-quality assessment system for electronic components; capability approval procedure; identical with IEC 47(Central Office)1117
€56.17
Semiconductor devices; rules for the indication of the polarity of currents and voltages; identical with IEC 47/47A(Central Office)1127/214
€41.78
Semiconductor devices; amendment to IEC 60749: gross leak test; identical with IEC 47(Central Office)1169
€34.30
Semiconductor devices; amendment to IEC 60749; external visual inspection; identical with IEC 47(Central Office)1170
Semiconductor devices; sealing test Q for semiconductor devices; identical with IEC 47(Central Office)1186
Semiconductor devices; amendment of testgroups B5, C5 and C7 of IEC 747-11; identical with IEC 47(Central Office)1187
Semiconductor devices; mechanical and climatic test methods, internal moisture content; identical with IEC 47(Central Office)1085
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/1636/CD:2002)
€48.79
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance; Unbiased autoclave (IEC 47/1637/CD:2002)
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power Cycling (IEC 47/1648/CD:2002)
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/2881/CDV:2024); German and English version prEN IEC 60749-23:2024
€69.91
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing; Machine model (MM) (IEC 47/1624/CDV:2002); German version prEN 60749-27:2002
€63.27
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing; Human body model (HBM) (IEC 47/1623/CDV:2002); German version prEN 60749-26:2002
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) (IEC 47/1615/CDV:2002); German version prEN 60749-14:2002
Semiconductor devices - Mechanical and climatic test methods - Part 25: Rapid change of temperature (air, air) (IEC 47/1616/CDV:2002); German version prEN 60749-25:2002
