Semiconductor devices; category of assessed quality; term and definition; identical with IEC 47(Secretariat)1246
€34.30
Semiconductor devices letter symbols for the logarithmic scale unit "decibel"; identical with IEC 47(Central Office)1319
Semiconductor devices; internal visual examination; procedure for discrete semiconductors; identical with IEC 47(Central Office)1053
€56.17
Semiconductor devices; internal visual examination; procedure for discrete semiconductors; identical with IEC 47(Central Office)1053-II
€77.20
Semiconductor devices; mechanical and climatic test methods; amendment to IEC 60749; identical with IEC 47(Central Office)1084
Semiconductor devices; amendment to the generic specification; IEC 60747-10/QC 700000; identical with IEC 47(Central Office)1092
Semiconductor devices; amendment to the generic specification IEC 60747-10; accelerated test procedures; identical with IEC 47/47A(Central Office)1116/205
Semiconductor devices; mechanical and climatic test methods; supplements to IEC 749; damp heat; identical with IEC 47(Central Office)1054
Semiconductor devices; terms and definitions for leakage current of analogue signal switching circuits; identical with IEC 47(Central Office)1108
Semiconductor devices; revision of the definition for forward direction and reverse direction; identical with IEC 47(Central Office)1120
Semiconductor devices; cut-off-frequency, terms and definitions; identical with IEC 47(Central Office)1121
Semiconductor devices; revision of IEC 60747-1, chapter IV, 2.16 layers; identical with IEC 47(Central Office)1122
Semiconductor devices; differential resistance (between two terminals), definition and letter symbol; identical with IEC 47(Central Office)1124
Semiconductor devices; revision of IEC 60747-1, chapters IV, V and VI, clauses on thermal characteristics and related temperatures; identical with IEC 47(Central Office)1126
Semiconductor devices; measurement of coplanarity of the leads; identical with IEC 47(Central Office)1230
