31.080.01 : Semiconductor devices in general

BS 3363:1980

BS 3363:1980

Superseded Historical

Specification for letter symbols for semiconductor devices and integrated microcircuits

€269.00

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BS 3363:Supplement No. 1:1981

BS 3363:Supplement No. 1:1981

Superseded Historical

Specification for letter symbols for semiconductor devices and integrated microcircuits

€193.00

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BS 3363:Supplement No. 2:1981

BS 3363:Supplement No. 2:1981

Superseded Historical

Specification for letter symbols for semiconductor devices and integrated microcircuits

€165.00

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BS 3939-5:1985

BS 3939-5:1985

Superseded Historical

Graphical symbols for electrical power, telecommunications and electronics diagrams Semiconductors electron tubes

€269.00

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BS CECC 00013:1985

BS CECC 00013:1985

Withdrawn Most Recent

Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice

€269.00

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BS 4727-1:Group 05:1985

BS 4727-1:Group 05:1985

Withdrawn Most Recent

Glossary of electrotechnical, power, telecommunication, electronics, lighting and colour terms. Terms common to telecommunications electronics Semiconductor terminology

€269.00

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BS 9300:1969

BS 9300:1969

Superseded Historical

Specification for semiconductor devices of assessed quality: generic data and methods of test

€404.00

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BS 6493-3:1985

BS 6493-3:1985

Superseded Historical

Semiconductor devices Mechanical and climatic test methods

€316.00

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25/30512405 DC:2025

25/30512405 DC:2025

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Draft BS EN 61582 Ed.2.0 Radiation protection instrumentation - Portable, transportable or installed equipment for in vivo measurement of photon emitting radionuclides

€23.00

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NF EN IEC 60749-21, C96-022-21PR (02/2026)

NF EN IEC 60749-21, C96-022-21PR (02/2026)

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Dispositifs à semiconducteur - Méthodes d'essai mécaniques et climatiques - Partie 21: Brasabilité

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NF EN IEC 60749-24, C96-022-24PR (02/2026)

NF EN IEC 60749-24, C96-022-24PR (02/2026)

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Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 24: Résistance à l'humidité accélérée - HAST sans polarisation

€47.00

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NF EN IEC 60749-7, C96-022-7PR (02/2026)

NF EN IEC 60749-7, C96-022-7PR (02/2026)

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Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 7: Mesure de la teneur en humidité interne et analyse des autres gaz résiduels

€59.00

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BS EN IEC 60749-26:2026

BS EN IEC 60749-26:2026

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Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

€374.00

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NF EN 60749-7, C96-022-7 (02/2012)

NF EN 60749-7, C96-022-7 (02/2012)

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Semiconductor devices - Mechanical and climatic test methods - Part 7 : internal moisture content measurement and the analysis of other residual gases - Dispositifs à semiconducteurs

€52.00

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NF EN 60749-5, C96-022-5 (07/2017)

NF EN 60749-5, C96-022-5 (07/2017)

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Semiconductor devices - Mechanical and climatic test methods - Part 5 : steady-state temperature humidity bias life test

€77.67

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