BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
€23.00
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
€193.00
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016.
€145.14
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1401/CD:2022); Text in German and English
€162.06
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2025); German version EN IEC 62276:2025.
€140.00
Piezoelectric sensors Generic specifications
€316.00
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines terminal lead connections Ceramic enclosures
€404.00
Measurement of quartz crystal unit parameters drive level dependence (DLD)
€269.00
Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary oscillators
Surface acoustic wave (SAW) and bulk (BAW) duplexers of assessed quality Generic specification
Surface acoustic wave (SAW) and bulk (BAW) duplexers of assessed quality Guidelines for the use
BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
BS EN IEC 60122-2. Quartz crystal units of assessed quality Part 2. Guide to the use
Draft BS EN IEC 60122-2 Quartz crystal units of assessed quality. Part 2. Guide to the use
BS EN IEC 60444-11. Measurement of quartz crystal unit parameters Part 11. Standard method for the determination load resonance frequency fL and effective capacitance CLeff using automatic network analyzer techniques error correction
