Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
€316.00
Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
€269.00
Gas analysis. Investigation and treatment of analytical bias
Expression of performance electrochemical analyzers General
Chemistry. Layout for standards Methods of chemical analysis
Surface chemical analysis. Data transfer format
€374.00
Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis
Surface chemical analysis. Information formats
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
€193.00
Expression of performance gas analyzers Paramagnetic oxygen
Recommendations for a standard layout for methods of chemical analysis by gas chromatography
General methods of chemical analysis Method for determination traces sulphur compounds by reduction and titrimetry
€165.00
General methods of chemical analysis Method for determination silicon content (reduced molybdosilicate spectrophotometric method)
General methods of chemical analysis Method for determination iron content (1,10-phenanthroline spectrophotometric method)
General methods of chemical analysis Method for determination chloride ions by potentiometry
