Chemical analysis of refractories containing alumina, zirconia, and silica. Refractories 5 percent to 45 ZrO2 (alternative the X-ray fluorescence method) Flame atomic absorption spectrophotometry (FAAS) inductively coupled plasma emission spectrometry (ICP-AES)
€193.00
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
€269.00
Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
€316.00
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Continuous syringe injection method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Diffusion method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Permeation method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Electrochemical generation
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Surface chemical analysis. Data transfer format for scanning-probe microscopy
Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
Breath alcohol test devices other than single use devices. Requirements and test methods
Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
