Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
€316.00
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
€374.00
Surface chemical analysis. Characterization of nanostructured materials
€355.00
Natural gas. Performance evaluation for analytical systems
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Piston pumps
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
€165.00
Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
€193.00
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Expression of performance electrochemical analyzers Electrolytic conductivity
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
€269.00
Surface chemical analysis. Information format for static secondary-ion mass spectrometry
Expression of performance electrochemical analyzers pH value
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Surface chemical analysis. Auger electron spectroscopy. Repeatability and constancy of intensity scale
