Gas analysis — Preparation of calibration gas mixtures using dynamic volumetric methods Part 5: Capillary calibration devices
€115.00
Gas analysis — Preparation of calibration gas mixtures using dynamic methods Part 2: Piston pumps
€183.00
Surface chemical analysis — Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy Amendment 1
€21.00
Gas mixtures — Gravimetric preparation — Mastering correlations in composition Technical Corrigendum 1
€0.00
Gas analysis — Preparation of calibration gas mixtures using dynamic methods Part 1: General aspects
€155.00
Gas analysis — Preparation of calibration gas mixtures Part 1: Gravimetric method for Class I mixtures
€208.00
Gas analysis — Preparation of calibration gas mixtures using dynamic methods Part 6: Critical flow orifices
Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
€355.00
Surface chemical analysis. Determination of the minimum detectability of surface plasmon resonance device
€193.00
Surface chemical analysis. Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
Animal feeding stuffs: Methods of sampling and analysis. Recommendations for the organization and evaluation of collaborative studies for multi-analyte methods of analysis
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
€165.00
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
€269.00
Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
