Gas analysis. Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
€316.00
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I
€355.00
Surface chemical analysis. Measurement of lateral and axial resolutions of a Raman microscope
€193.00
Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
Bio-based products. Use of stable isotope ratios of Carbon, Hydrogen, Oxygen and Nitrogen as tools for verification of the origin of bio-based feedstock and characteristics of production processes. Overview of relevant existing applications
€269.00
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Surface chemical analysis. Vocabulary General terms and used in spectroscopy
€404.00
BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
€23.00
BS ISO 6142-2. Gas analysis. Preparation of calibration gas mixtures Part 2. Gravimetric method for Class II
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class II
Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy
€374.00
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
