Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy. Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
€269.00
Safety requirements for electrical equipment measurement, control and laboratory use Particular the heating of Materials
€193.00
Safety requirements for electrical equipment measurement, control and laboratory use Particular mixing stirring
€165.00
Safety requirements for electrical equipment measurement, control and laboratory use Particular atomic spectrometers with thermal atomization ionization
Safety requirements for electrical equipment measurement, control and laboratory use Particular in vitro diagnostic (IVD) medical
€255.00
Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
€316.00
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Safety requirements for electrical equipment measurement, control and laboratory use Particular cabinet x-ray systems
Laboratory installations. Capture devices with articulated extract arm
Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Surface chemical analysis. Vocabulary General terms and used in spectroscopy
€404.00
Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy
€374.00
Expression of performance gas analyzers Photometric
