71.040 : Analytical chemistry

71.040.01

Analytical chemistry in general

71.040.10

Chemical laboratories. Laboratory equipment

71.040.20

Laboratory ware and related apparatus

71.040.30

Chemical reagents

71.040.40

Chemical analysis

71.040.50

Physicochemical methods of analysis

71.040.99

Other standards related to analytical chemistry
UNE-EN 15964:2012 (R2017)

UNE-EN 15964:2012 (R2017)

Active Most Recent

Breath alcohol test devices other than single use devices - Requirements and test methods

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UNE-EN 16280:2013 (R2019)

UNE-EN 16280:2013 (R2019)

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Breath alcohol test devices for general public - Requirements and test methods

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UNE-EN 1744-1:2010+A1:2013 (R2015)

UNE-EN 1744-1:2010+A1:2013 (R2015)

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Tests for chemical properties of aggregates - Part 1: Chemical analysis

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UNE-EN 15768:2015 (R2021)

UNE-EN 15768:2015 (R2021)

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Influence of materials on water intended for human consumption - GC-MS identification of water leachable organic substances

€82.00

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BS EN 14470-2:2006

BS EN 14470-2:2006

Active Most Recent

Fire safety storage cabinets Safety for pressurised gas cylinders

€193.00

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BS EN 14470-1:2004

BS EN 14470-1:2004

Superseded Historical

Fire safety storage cabinets Safety for flammable liquids

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BS ISO 18516:2006

BS ISO 18516:2006

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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution

€316.00

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DD ISO/TS 15338:2009

DD ISO/TS 15338:2009

Superseded Historical

Surface chemical analysis. Glow discharge Mass spectrometry (GD-MS). Introduction to use

€316.00

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BS ISO 24173:2009

BS ISO 24173:2009

Withdrawn Most Recent

Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

€374.00

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PD ISO/TR 16268:2009

PD ISO/TR 16268:2009

Active Most Recent

Surface chemical analysis. Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation

€269.00

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BS ISO 23812:2009

BS ISO 23812:2009

Active Most Recent

Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials

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BS ISO 23830:2008

BS ISO 23830:2008

Active Most Recent

Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

€269.00

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PD IEC/TR 62456:2007

PD IEC/TR 62456:2007

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An electrochemical reference system for use in different solvent media. The decamethylated ferricinium/ferrocene redox couple

€165.00

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BS EN ISO 835:2007

BS EN ISO 835:2007

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Laboratory glassware. Graduated pipettes

€193.00

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BS ISO 17470:2014

BS ISO 17470:2014

Active Most Recent

Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

€193.00

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