22/30437195 DC:2022
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22/30437195 DC:2022

BS IEC 62047-43. Semiconductor devices. Micro-electromechanical devices Part 43. Test method of electrical characteristics after cyclic bending deformation for flexible electro-mechanical
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Summary

Semiconductor manufacture;Semiconductor technology;Electromechanical storage;Bend testing;Testing methods;Characteristics;Performance characteristics

Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 02/11/2022
Page Count 18
EAN ---
ISBN ---
Weight (in grams) ---

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