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BS IEC 62047-43:2024
Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical
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Summary
Semiconductor manufacture;Semiconductor technology;Electromechanical storage;Bend testing;Testing methods;Characteristics;Performance characteristics
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 03/22/2024 |
| Page Count | 22 |
| Themes | Performance characteristics |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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