ASTM E673-03
Withdrawn Standard
Most Recent

ASTM E673-03

Standard Terminology Relating to Surface Analysis (Withdrawn 2012)

Summary

1.1 This terminology is related to the various disciplines involved in surface analysis.

1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).

Technical characteristics

Publisher American Society for Testing and Materials (ASTM International)
Publication Date 12/01/2003
Cancellation Date 01/01/2012
Collection
Page Count 10
Themes Properties of surfaces
EAN ---
ISBN ---
Weight (in grams) ---

Replaces

Previous versions

Contact us