Superseded
Standard
Historical
BS EN 15991:2011
Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
No description.
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 02/28/2011 |
| Cancellation Date | 11/30/2015 |
| Page Count | 32 |
| Themes | Raw materials |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.