Superseded Standard
Historical

BS EN 15991:2015

Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

Summary

Ceramics;Carbides;Determination of content;Vaporization;Trace element analysis;Chemical analysis and testing;Silicon inorganic compounds;Particulate materials;Raw materials;Refractory materials;Impurities;Emission spectrophotometry

Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 11/30/2015
Cancellation Date 09/26/2025
Page Count 30
Themes Emission spectrophotometry
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