BS EN 60749-20:2003
Superseded Standard
Historical

BS EN 60749-20:2003

Semiconductor devices. Mechanical and climatic test methods Resistance of plastic-encapsulated SMDs to the combined effect moisture soldering heat
Most recent standard
No description.

Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 07/07/2003
Cancellation Date 01/31/2010
Page Count 28
Themes Semiconductor devices
EAN ---
ISBN ---
Weight (in grams) ---
No products.

Previous versions

Contact us