Superseded
Standard
Historical
BS EN 60749-29:2003
Semiconductor devices. Mechanical and climatic test methods Latch-up
No description.
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 06/29/2004 |
| Cancellation Date | 08/31/2011 |
| Page Count | 24 |
| Themes | Electronic equipment and components |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
31/08/2011
Active
Most Recent
29/06/2004
Superseded
Historical