BS EN 60749-29:2011
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BS EN 60749-29:2011

Semiconductor devices. Mechanical and climatic test methods Latch-up

Summary

Climate;Electrical testing;Overvoltage;Destructive testing;Failure rate;Environmental testing;Overvoltage tests;Mechanical testing;Electronic equipment and components;Integrated circuits;Semiconductor devices;Electrical faults;Electrical impedance

Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 08/31/2011
Page Count 26
Themes Electrical impedance
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