Superseded
Standard
Historical
BS EN 60749-4:2002
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress (HAST)
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 09/10/2002 |
| Cancellation Date | 11/28/2017 |
| Page Count | 12 |
| Themes | Semiconductor devices |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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