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BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress (HAST)
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Summary
Environmental testing;Semiconductor devices;Integrated circuits;Electronic equipment and components;Climate;Accelerated testing;Mechanical testing;Damp-heat tests
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 11/28/2017 |
| Page Count | 16 |
| Themes | Damp-heat tests |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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