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BS EN IEC 63287-1:2021
Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability
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Summary
Semiconductor devices;Reliability;Electrical failure;Tests;Test methods
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 11/30/2021 |
| Page Count | 50 |
| Themes | Test methods |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
Replaces
22/09/2017
Superseded
Historical