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BS ISO 14701:2011
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 08/31/2011 |
| Cancellation Date | 11/05/2018 |
| Page Count | 24 |
| Themes | Spectroscopy |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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05/11/2018
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31/08/2011
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