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BS ISO 14701:2018
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
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Summary
Spectroscopy;Thickness measurement;Photoelectron spectroscopy;X-ray photoelectron spectroscopy;Surface chemistry;Silicon;Chemical analysis and testing;Surface properties;Oxides;Electron emission
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 11/05/2018 |
| Page Count | 26 |
| Themes | Electron emission |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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05/11/2018
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31/08/2011
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