Active
Standard
Most Recent
BS ISO 16413:2020
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
Preview
Summary
X-ray apparatus;X-ray analysis;Instruments;Density measurement;X-rays;Thickness measurement
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 08/18/2020 |
| Page Count | 42 |
| Themes | Thickness measurement |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
Replaces
Previous versions