Superseded
Standard
Historical
BS ISO 20263:2017
Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
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Summary
Electron microscopes;Materials by form;Analysis;Interfaces;Measurement
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 01/04/2018 |
| Cancellation Date | 11/19/2024 |
| Page Count | 54 |
| Themes | Measurement |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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