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BS ISO 20263:2024
Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 11/19/2024 |
| Page Count | 56 |
| Themes | Measurement |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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