Superseded
Standard
Historical
BS ISO 25498:2010
Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 06/30/2010 |
| Cancellation Date | 03/23/2018 |
| Page Count | 40 |
| Themes | Chemical analysis and testing |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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