Superseded
Standard
Historical
BS ISO 25498:2018
Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
Preview
Summary
Chemical analysis and testing;Electron diffraction;Spectroscopy;Test specimens;Microanalysis;Crystal lattices;Electron microscopes;Electron beams;Optical instruments
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 03/23/2018 |
| Cancellation Date | 05/16/2025 |
| Page Count | 48 |
| Themes | Optical instruments |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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