DIN 50440-1:1981-11
Superseded Standard
Historical

DIN 50440-1:1981-11

Testing of materials for semiconductor technology; measurement of recombination carrier lifetime in silicon single crystals by means of photo conductive decay method; measurement on bar-shaped specimens
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Summary

Prüfung von Materialien für die Halbleitertechnologie; Messung der Rekombination-Trägerlebensdauer in Silicium-Einkristallen nach dem Photoleitfähigkeitsverfahren; Messung an quaderförmigen Proben

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 11/01/1981
Page Count 8
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ISBN ---
Weight (in grams) ---
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