DIN 50441-1:1981-02
Superseded Standard
Historical

DIN 50441-1:1981-02

Testing of semiconductive inorganic materials; determination of the geometric dimensions of semiconductor slices; measurement of thickness
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Summary

Prüfung halbleitender anorganischer Stoffe; Messung der geometrischen Dimensionen von Halbleiterscheiben; Messung der Dicke

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 02/01/1981
Page Count 8
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ISBN ---
Weight (in grams) ---
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