Superseded
Draft standard
Historical
DIN 50441-1:1994-12
Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 1: Thickness and thickness variation
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Summary
Prüfung von Materialien für die Halbleitertechnologie - Messung der geometrischen Dimensionen von Halbleiterscheiben - Teil 1: Dicke und Dickenvariation
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 12/01/1994 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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