DIN 50989-1:2018-03

Ellipsometry - Part 1: Principles; Text in German and English

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Description

Features

Life cycle

Historical

Summary

This standard deals with the ellipsometry, a method for determining optical and dielectric constants in the UV-VIS-NIR spectral range as well as layer thicknesses, in the range of at-line production control, quality assurance and material development.

Technical characteristics

Publisher	Deutsche Institut für Normung e.V. (DIN)
Publication Date	03/01/2018
Page Count	35
EAN	---
ISBN	---
Weight (in grams)	---
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