DIN EN 15991:2011-04
Superseded Standard
Historical

DIN EN 15991:2011-04

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV); German version EN 15991:2011
Most recent standard

Summary

This European Standard defines a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide. Dependent on element, wavelength, plasma conditions and weight, this test method is applicable for mass contents of the above trace contaminations from about 0,1 mg/kg to about 1000 mg/kg, after evaluation also from 0,001 mg/kg to about 5000 mg/kg.

Notes

À remplacer par DIN EN 15991 (2014-07).

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 04/01/2011
Cancellation Date 02/01/2016
Page Count 28
EAN ---
ISBN ---
Weight (in grams) ---
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Previous versions

DIN EN 15991:2025-11

DIN EN 15991:2025-11

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry with electrothermal vaporisation (ETV-ICP-OES); German version EN 15991:2025
01/11/2025
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Most Recent
DIN EN 15991:2024-07

DIN EN 15991:2024-07

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry with electrothermal vaporisation (ETV-ICP-OES); German and English version prEN 15991:2024
01/07/2024
Superseded
Historical
DIN EN 15991:2016-02

DIN EN 15991:2016-02

Essais sur matériaux céramiques et basiques - Détermination directe des fractions massiques d'impuretés dans les poudres et les granulés de cabure de silicium par spectroscopie d'émission optique à plasma induit par haute fréquence (ICP OES) avec vaporisation électrothermique (ETV); Version allemande EN 15991:2015
01/02/2016
Superseded , Under review
Historical
DIN EN 15991:2014-07

DIN EN 15991:2014-07

Essais sur matériaux céramiques et basiques - Détermination directe des fractions massiques d'impuretés dans les poudres et les granulés de matières premières et basiques céramiques non obtenus par oxydation par spectroscopie d'émission optique avec plasma induit par haute fréquence (ICP OES) avec vaporisation électrothermique (ETV); Version allemande prEN 15991:2014
01/07/2014
Superseded
Historical
DIN EN 15991:2011-04

DIN EN 15991:2011-04

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV); German version EN 15991:2011
01/04/2011
Superseded
Historical
DIN EN 15991:2009-09

DIN EN 15991:2009-09

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of non-oxidic ceramic raw and basic materials by inductively coupled plasma optical emission spectroscopy (ICP OES) with electrothermal vaporisation (ETV); German version prEN 15991:2009
01/09/2009
Superseded
Historical
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