Superseded
Draft standard
Historical
DIN EN 60749-1:2002-06
Semiconductor devices - Mechanical and climatic test methods - General (IEC 47/1571/CDV:2001); German version prEN 60749-1:2001
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Summary
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Allgemeines (IEC 47/1571/CDV:2001); Deutsche Fassung prEN 60749-1:2001
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 06/01/2002 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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