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DIN EN 60749-1:2003-12
Semiconductor devices - Mechanical and climatic test methods - Part 1: General (IEC 60749-1:2002 + Corr. 1:2003); German version EN 60749-1:2003.
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Summary
This part of DIN EN 60749 is applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all other parts of the series.
Notes
DIN EN 60749 (2002-09) remains valid alongside this standard until 2005-10-01.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 12/01/2003 |
| Page Count | 10 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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