Superseded
Standard
Historical
DIN EN 60749-13:2003-04
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2002); German version EN 60749-13:2002.
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Summary
The document describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.
Notes
Under certain conditions, DIN EN 60749 (2002-09) remains valid alongside this standard until 2005-07-01.*A transition period, as set out in DIN EN IEC 60749-13 (2018-10), exists until 2021-03-22.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 04/01/2003 |
| Cancellation Date | 10/01/2018 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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