Superseded
Draft standard
Historical
DIN EN 60749-13:2017-07
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 47/2377/CDV:2017); German version prEN 60749-13:2017
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Summary
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion.
Notes
Prévu pour remplacer DIN EN 60749-13 (2003-04).
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 07/01/2017 |
| Cancellation Date | 10/01/2018 |
| Page Count | 24 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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