Superseded
Standard
Historical
DIN EN 60749-30:2005-06
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005); German version EN 60749-30:2005.
Preview
Summary
This part of DIN EN 60749 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount-devices (SMDs) prior to reliability testing.
Notes
A transition period, as set out in DIN EN 60749-30 (2011-12), exists until 2014-06-29.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 06/01/2005 |
| Page Count | 15 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
01/12/2011
Superseded
Historical
