Superseded
Standard
Historical
DIN EN 60749-30:2011-12
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005 + A1:2011); German version EN 60749-30:2005 + A1:2011.
Preview
Summary
This part of DIN EN 60749 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount-devices (SMDs) prior to reliability testing. The incorporated Amendment updates the requirements to be in line with IEC 60749:20:2008.
Notes
DIN EN 60749-30 (2005-06) remains valid alongside this standard until 2014-06-29.*A transition period, as set out in DIN EN IEC 60749-30 (2023-02), exists until 2023-09-21.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 12/01/2011 |
| Page Count | 14 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
01/06/2005
Superseded
Historical