Superseded
Draft standard
Historical
DIN EN 60749-43:2013-10
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plan (IEC 47/2169/CD:2013)
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Summary
The guideline shall apply to semiconductor integrated circuit (IC) products for automotive and generalapplications.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 10/01/2013 |
| Cancellation Date | 05/01/2018 |
| Page Count | 63 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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